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Influence of working conditions on the results of X-ray analysis in the low vacuum scanning electron microscope
Hudzik, Martin ; Zimáková, Jana (referee) ; Čudek, Pavel (advisor)
Bachelor’s thesis deals with detection of characteristic X-Ray and energy dispersive spectroscopy in the environment of low vacuum scanning electron microscope. Describes the detection of X-Ray by silicon drifted detector and also describes the principles of qualitative and quantitative X-Ray analysis. The objective of this thesis is to perform energy dispersive spectroscopy of known elements under the optimal conditions and to monitor changes of parameters and results of the spectroscopy during the change of working conditions in low vacuum scanning electron microscope Vega3 XMU with Xflash 6|10 spectroscope.
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Design of secondary electron detector for ultrahigh vacuum electron microscope
Skladaný, Roman ; Zigo, Juraj (referee) ; Bábor, Petr (advisor)
In this master’s thesis, a mechanical design of an in-column secondary electrons (SE) detector is presented. It is an ultravacuum compatible fibre-scintillation detector designed for use in an ultrahigh vacuum scanning electron microscope (UHV SEM). The designed in-column SE detector was manufactured and tested upon overcoming R&D challenges. The first section of this thesis deals with theoretical basis needed for understanding of functional principles of UHV SEM system and means of SE’s detection. In the second section, mechanical design of the in-column SE detector is described. The last section describes functionality of the designed detector. Effectiveness of light shielding of the detector was tested and the detective quantum efficiency was measured. Finally, images created by the designed in-column detector and an in-chamber SE detector were evaluated and compared.
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Ionization detector of secondary electrons for environmental scanning electron microscope
Dušek, Petr ; Zimáková, Jana (referee) ; Čudek, Pavel (advisor)
This thesis deals with problematics of a detection of secondary electrons by ionization detector for environmental scanning electron microscope. In this thesis is described the difference between scanning electron microscope and environmental scanning electron microscope. Further there is described emission and detection of the choosen signals that arise while primary electrons are interacting with a specimen in scanning electron microscope. A special emphasis is placed on a description, sorting and on the form of detection of secondary electrons. In thesis there is described principle of a function of ionization a scintilation detectors. Experimental part of thesis describes design of 3 different elctrode systems of a tabular ionization detector, which will be intended to be placed in environmental scanning electron microscope. Based on measuring with the detectors, with experimental design, there is chosen one with the highest quality of signal detection.
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Analysis of non-metalic inclusions in motor heads castings and suggestion on their remove
Dratnal, Lukáš ; Lána, Ivo (referee) ; Roučka, Jaromír (advisor)
Improving the quality of metal castings for serial production of automotive industry, leading to improvements in the properties of casts and their lower costs. This publication analyzes the non-metallic inclusions contained in casts of heads of internal combustion engines, molded of Nemak Czech Republic, Ltd. Tackling includes analysis of size, shape, chemical composition and hardness of the specific non-metallic inclusions. The thesis describes the purity metal holding furnaces and proposals to eliminate inclusions from metal.
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Diagnostic of semiconductor materials by EBIC method
Davidová, Lenka ; Máca, Josef (referee) ; Čudek, Pavel (advisor)
Master´s thesis is focused on diagnostics of semiconductor materials by EBIC method (measuring of currents induced beam), determination of the lifetime of minority carriers, or their diffusion length. The theoretical part is aimed at the principle of scanning electron microscopy, the characteristic properties of the microscope and the signals generated by the interaction of the primary electron beam with the sample. The thesis describes a structure of semiconducting silicon, band models, types of lattice defects and doped of semiconductor structures. After that it is described the theory of calculation of the diffusion length of minority carriers in semiconductors of type N and P. The aim of the experiment part of the thesis is to measure the properties of the semiconductor structure by EBIC and determination of diffusion length and lifetime of minority charge carriers based on the measured data The aim of the experiment part of the thesis is to measure the properties of the semiconductor structure by EBIC and determination of diffusion length and lifetime of minority charge carriers on the basis of the measured data.
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Influence of working conditions on the signal level detected by LVSTD detector
Tylich, Ondřej ; Zimáková, Jana (referee) ; Čudek, Pavel (advisor)
This bachelor project includes information about function of low vacuum scanning electron microscope and describes it’s parts. It explains the difference between low vacuum and high vacuum scannig electron microscope. Contains informations about creation and detection of secondary electrons using scintillation detectors. It describes the calculation of signal to noise ratio and the method for obtaining the values of signal. Project is focused to determine the value of signal with a change in working conditions obtained by using Low Vacuum Secondary Electron Detector TESCAN (LVSTD). The aim is to determine the stability of the effect of working conditions on LVSTD.
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Influence of working conditions on results of EDS analysis in environmental SEM
Kaplenko, Oleksii ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
The bachelor thesis contains an operating principle of the environmental scanning electron microscope (ESEM), issue of detection of characteristic X-Ray by using an energy dispersive spectroscopy method. The work describes detection of X-rays through silicon drifted detector, and also the principle of qualitative and quantitative X-ray microanalysis. The aim of this work is to study the influence of working conditions in the scanning electron microscope VEGA3 XMU equipped with Xflash 6 | 10 spectroscope on the results of X-ray microanalysis and their evaluations.
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Piezoelectric nanofiber materials for wearable electronics
Frolíková, Štěpánka ; Škarvada, Pavel (referee) ; Macků, Robert (advisor)
This thesis deals with the influence of production parameters on the morphology of PVDF nanofibers produced by electrospinning. Nanofibers are generally a widely used material, nanofibers are generally a widely used material, they can also have piezoelectric properties, which gives them a specific spectrum of use, eg in biosensors. The production of nanofibers was realized by electrospinning. A scanning electron microscope was used to examine the morphology and surface properties. The aim of this thesis is to compare the properties of PVDF nanofibers produced under different settings of production parameters.
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Image analysis for correction of electron microscopes
Smital, Petr ; Schwarz, Daniel (referee) ; Kolář, Radim (advisor)
This thesis describes the physical nature of corrections of an electron microscope and mathematical methods of image processing required for their complete automation. The corrections include different types of focusing, astigmatism correction, electron beam centring, and image stabilisation. The mathematical methods described in this thesis include various methods of measuring focus and astigmatism, with and without using the Fourier transform, edge detection, histogram operations, and image registration, i.e. detection of spatial transformations in images. This thesis includes detailed descriptions of the mathematical methods, their evaluation using an “offline” application, descriptions of the algorithms of their implementation into an actual electron microscope and results of their testing on the actual electron microscope, in the form of a video footage grabbed from its control computer’s screen.
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Design of electron microscope
Havlíček, Petr ; Kobosil, Karel (referee) ; Zvonek, Miroslav (advisor)
The aim of my Master's thesis is the design of a scanning electron microscope. The designed concept presents an innovative approach to the problems and respects all technical, ergonomic and aesthetical demands made on it. The main creative part of design process starting from the concept development and ending up with the final solution is preceded by a background research study including a historical, technical and design analysis of the electron microscope. The conclusion of my Master's thesis analyses the final design, its character and its contribution in broader context.
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